Effective & Efficient Elemental Analysis with ASPEX EXplorer
Now in its third generation, the ASPEX EXplorer is a
scanning electron microscope that is designed for the automated imaging and elemental analysis of a wide spectrum of surfaces and particulate. A unique blend of hardware ruggedization and software sophistication creates a system platform that is readily accessible.
The ASPEX EXplorer system provides a fully integrated SEM and EDX platform for addressing the microscale visualization needs of a diverse range of users. It seamlessly provides high magnification imaging, rapid nondestructive compositional analysis, and robust computer automation for size, shape and elemental composition.
Industry uses for Elemental Analysis:
- Forensics
- Health Sciences
- Industrial Automation
- Metals
Industrialized by Design
The following founding manufacturing philosophies enable ASPEX's units to be installed where the competition has never been:
- Stability & Reproducibility
- Minimized Downtime
- Reliability & Serviceability
- Evolved Staging
- Environmental Shielding
- Ease of Use
- Guaranteed Performance
Seamless Solutions for Microanalysis
Each ASPEX EXplorer comes equipped with the Perception software suite. When your needs go beyond manual microanalysis, Perception provides a powerful set of productivity tools for microanalysis.
Perception becomes the most efficient and accurate way to perform microanalysis when coupled with optional ASPEX software such as:
- AFA Automated Feature Analysis
- CFA Complex Feature Analysis
- MQA Metal Quality Analysis
- GSR Gun Shot Residue Analysis
Performance and Features
Guaranteed Performance**
| Particle Detection Efficiency |
Greater than 95% |
| Particle Sizing Precision |
0.25 microns or better |
| Particle Sizing Accuracy |
0.5 microns or better |
| Occurrence of False Positives |
Less than 1 per mm2 |
| Particles Sized per Hour |
Up to 33,000 |
| Particles Sized per Hour |
Up to 10,000 |
| (composition, size, morphology, imaging) |
|
**Performance as measured using the Performance Grading System™ for features 1 to 100 μm.
Performance Specifications
| Particle Detection Range |
30nm to 5mm |
| Detectors |
SED, Quad BSED, SDD EDX |
| Accelerating Voltage |
0.2 to 25 KeV Continuous |
| Stage Movement |
80mm x 100mm |
| Vacuum system |
High Vac and Variable Pressure |
| Lightest Element Detection |
Boron |
| EDX Resolution |
135 eV |
| Sizing Algorithms Available |
RCA and CFA |
| FDA Compliance Level |
cGMP |
| Data Security |
21 CFR part 11 Compliant* |
Sample Handling & Navigation
| Specimen Coverage |
6” Sample-Complete |
| Stage Motorization |
80mm x 100mm XY, Manual Z |
| Chamber Dimensions |
180mm x 230mm x 140mm |
| Interactive Navigation |
MacroNavigator™ |
Valued Added Services
| Advanced Training |
Custom, In-House or On-Site |
| Contract Services |
Automated Particle Analysis |
| Method Development |
Validated and Transferable |
| Consultation |
Concept to Commercialization |
Field Service & Customer Support
| Response Time |
2-Hour Phone Response, 24/7 |
| Field Service Engineers |
Pittsburgh headquarters and regionally based throughout the United States |
| Remote Diagnostics |
Standard Component, enabling system operation |
| System Monitoring |
Harvester™ Software, monitoring and documenting multiple sub-system |
*Indicates options available