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About ASPEX - The World is
Getting Smaller.
Learn more about ASPEX and how we've revolutionized microanalysis.
- Message from ASPEX - Our technology can help your organization achieve new standards of excellence.
- Mission Statement - To provide high-productivity e-beam imaging and microanalysis tools for factory-floor, field, and lab environments.
- Value Proposition - We combine imaging, elemental analysis, automated control software, statistical analysis, and data management and integrity capabilities for demanding 24/7 production environments.
- History - Our origins date back to 1992. We're known for developing the world's first personalized scanning electron microscope (PSEM).
- Press Room - Read about how ASPEX isbeing recognized in the media for revolutionizing microanalysis.
- Upcoming Events - Test drive an ASPEX SEM at a location near you.
- Careers - Learn about our current job openings and apply now!
Reliable Classification of Particles
by Elemental Composition.
In its quest for higher standards of quality control and critical
cleanliness, industry is probing deeper into the microworld of particle
size analysis. Manufacturers recognize that by reducing microcontamination
in their products, they can improve quality, reduce warranty costs,
and enhance customer satisfaction. Research and engineering labs
know that understanding the structure and performance of materials
at the sub-micron level is crucial to innovation. Our justice system
depends upon microscopic evidence to solve crimes, and the military
has discovered that microscopy, when coupled with elemental analysis,
can be a powerful predictive maintenance tool for high-performance
engines. In
case after case, automated imaging of particles via a focused electron
beam has been demonstrated to be the most reliable technique for accurate
assessment of particle size and shape, as well as the only technique
that also provides reliable classification of individual particles
by elemental composition.
ASPEX (Application Specific Products employing Electron
Beam and X-ray technology) has engineered
a particle imaging system that harnesses the full power and dynamic
flexibility of electron-beam analysis, packaged in a compact and fully
integrated system with total support. When accurate particulate
characterization is important, electron-beam analysis is the method
of choice.
Contact us to test-drive one of our automated SEMs.
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