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Variable
Pressure Option
ASPEX with Perception can be equipped with a Variable Pressure option
for insulating materials. It typically eliminates the need for special
specimen coating to dissipate charge and remove artifacts. A special
differential vacuum system allows operation of the specimen chamber
at pressures up to 1 torr. Most charging effects can be eliminated
by imaging at a specimen pressure of 100–200 millitorr. Operating
at elevated pressure is also desirable when examining samples that
outgas and contaminate the vacuum. The Variable Pressure function
is fully automatic once the desired specimen pressure is selected.
A single "click" returns the system to the normal "high
vacuum" mode.
MicroNavigator
Though light-optical microscopes and electron-beam imaging provide
complementary information, it is often quite difficult in practice
to relocate precisely the same features. MicroNavigator is a versatile
aid that allows features located with a light-optical microscope
to be easily relocated for imaging under the electron beam or vice
versa.
MacroNavigator
When working at higher magnifications, it is easy to lose the "big
picture" and get lost.
MacroNavigator captures a full-color "macro view" image
of the specimen and displays it on the Perception console screen
as a navigation aid. The operator can instantly observe the current
image, and move to any desired feature of the specimen by a simple
"point and click." Simple, effective, and convenient,
MacroNavigator is a standard and exclusive feature of ASPEX with
Perception systems.
Stage Options
Standard Chamber:
180mm x 230mm x140mm
Stages:
XY – 50mm x 50mm
XYZ* – 50mm x 45mm x 20mm
XYR – 50mm x 50mm x 360° Rotate
XYZ*R – 50mm x 45mm x 20mm x 360° Rotate
XYRT – 50mm x 50mm x 360° Rotate x 115° Tilt (-45°
+ 70°)
XYZ*RT – 50mm x 45mm x 20mm x 360° Rotate x 115° Tilt
( -45° + 70°)
XY – 80mm x 100mm
XYR – 80mm x 100mm x 360° Rotate
Z axis is manual
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Digital Energy
Dispersive X-Ray Analysis (EDX) System (30 sq mm)
Triple the active area for X-ray detection and shorten your analysis
time. The large X-ray detection area lets you reach the required
number of X-ray counts in less time. Perception's sophisticated
automated analysis software is fully compatible with this option,
letting you take full advantage of the large X-ray detection area.
Chamber
View
The Chamber View infrared camera option provides a live view of
the chamber's interior, intended to assist the operator in positioning
samples under the beam while avoiding contact with microscope components.
It is particularly recommended for use in conjunction with the rotate/tilt
module or when large/irregular specimens are viewed. A small monochrome
monitor is included with the option
Click
here for larger image.
BSED
The backscatter detector is highly recommended for any application
involving discrimination of materials characterized by differences
in
average atomic number and as a requirement for most automated
applications. The detector is an annular quadrant type and is
controlled by an integrated low-noise electronics package. Control
of the detector is accomplished via a versatile graphical interface
that
provides for simple quadrant balancing to achieve different effects.
The ASPEX-Perception interface permits variable mixing of the backscattered
and secondary electron signals.
WDS
A WDS (Wavelength-Dispersive Spectrometer), with its superior ability
to differentiate X-ray emissions, provides better sensitivity than
EDS for discriminating overlapping elements. The spectrometer can
be equipped with four sequentially selectable crystals, each of
which provides coverage for a range of emissions. The spectrometer
is automated via its own independent computer system (not integrated
into the Perception console). One or two spectrometers can be fitted,
in addition to an EDS.
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