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 PSEM 3025 Data Sheet
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ASPEX patented drawer-type staging |
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ASPEX Personal Scanning Electron Microscope
PSEM 3025
The
only truly integrated SEM/EDX system
Now in its third generation,
the ASPEX PSEM 3025 is designed for the automated imaging and analysis
of inorganic specimens in the millimeter to sub-micron range. It's ideally suited for routine, 24/7 production environments,
and is designed to meet the imaging and microanalysis needs of 95%
of the industrial microscopy marketplace as well as general
and forensic laboratories.
Faster, and with greater accuracy
Each
ASPEX PSEM comes equipped with the Perception software suite, which
provides a powerful set of productivity tools for microanalysis. When
coupled with optional ASPEX software such as AFA, CFA, or GSR, it becomes a fully automated particle analysis system—faster,
and with greater accuracy and at a lower cost, than can be achieved
by other means.
Analyze the unknown and unseen
The PSEM works in a broad spectrum of production-environment and laboratory applications.
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| Performance Specifications |
| Particle detection efficiency |
greater than 99% |
| Particle sizing precision |
0.25 microns or better |
| Particle sizing accuracy |
0.5 microns of better |
| Occurence of false positives |
less than 1 per mm2 |
| Particles sized per hour |
up to 33,000 |
| Particles characterized/hour |
up to 1,800 |
| Instrument Features |
| Particle detection range |
100nm to 5mm |
| Detectors |
SED, Quad BSED, Si (Li) EDX |
| Accelerating voltage |
0.2 to 25 KeV |
| Stage movement |
80mm x 100mm |
| Vacuum system |
high vac and variable pressure |
| Imaging resolution |
7nm |
| Lightest element detection |
boron |
| EDX resolution |
135 eV |
| Sizing algorithms available |
RCA and CFA |
| FDA compliance level |
cGMP |
| FDA compliance status |
validated |
| Data security |
21 CFR part 11 compliant* |
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