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Technical
Specifications (PSEM)
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Electron
Optics
Magnification
Clear images from 10x to 50,000x
(continuous) in industrial environments
Detectors
Optimized secondary electron detector (SED)
Option: backscattered electron detector (BSED) with individually
adjustable quadrants
SED and BSED signal mixing
Beam path column liner
Precleaned disposable system
includes anode and aperture
Beam voltage
1-20 keV continuous
Electron gun
Tungsten filament
Pre-aligned disposable cartridge
Lens system
Three-lens condenser plus objective
Objective aperture
Pre-centered in liner tube
Astigmatism correction
8 pole — manual/automatic
Microanalysis Performance
SEM/EDS
Single-vendor designed,
developed, and supported
Elemental acquisitions
Single mouse-click
EDS and digital image file format
Consolidated image format
X-ray maps
Unlimited number of simultaneously collected maps, background and
overlap corrected
Automated analysis
Acquire sizing data on 6,000 particles in less than 10 minutes
Acquire sizing, elemental, and imaging data on 300 particles in
less than 10 minutes
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Specimen
Chambers and Stages
(WxLxH) Nominal Dimensions
Standard chamber
180mm x 230mm x 140mm (7.25" x 9.25" x 5.75")
Stages
XY — 50mm x 50mm
XYZ* — 50mm x 45 mm x 20mm
XYR — 50mm x 50mm x 360º Rotate
XYZ*R — 50mm x 45mm x 20mm x 360º Rotate
XYRT — 50mm x 50 mm x 360º Rotate x 115º Tilt (-45º + 70º)
XYZ*RT — 50mm x 45mm x 20mm x 360º Rotate x 115º Tilt
(-45º + 70º)
XY — 80mm x100mm
XYR — 80mm x100mm x 360º Rotate
*Z axis is manual
Reproducibility
All stages have 10 micron relocation
repeatability for XY motion
Automation
All stage axes are motorized except as noted
Console Control System
Console system
Latest Microsoft® Windows® operating system
Monitors
Two 15-inch flat-screen LCD monitors
Image storage
Tiff format (standard), jpg, bitmap,
TGA, PCX, PNG, WMF, PSD, FPX are supported
Text writing
Ability to annotate images
Specifications subject to change without notice. |
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