ASPEX Corporation  

Automated particle analysis for quality control and predictive maintenance

 
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imaging analysis sem

Send us your sample to have it
scanned by one of our SEMs
and posted on the Aspex gallery!


pica 1020
 

Why ASPEX?

The simple answer is performance. When our systems are matched head-to-head against general-purpose SEM/EDX units in particle characterization applications, we consistently overmatch the competition in speed and accuracy, as well as reduced total cost of ownership and maintenance. Others treat automated particle size analysis as a sideline—for ASPEX, it is our business, and our dedication and experience shows.

The most familiar embodiment of focused electron-beam imaging is the well-known Scanning Electron Microscope (SEM), for which there exist many suppliers, of which ASPEX is one. And X-ray analysis accessories and image analysis software are available from still other vendors.


We put it all together in one compact, easy-to-use, and fully supported unit.
This is not just a matter of convenience and economics, but also involves major performance considerations. Configuring an electron-beam particle analyzer from a general-purpose SEM equipped with a general-purpose frame-capture accessory and a third-party X-ray analysis unit gives up significant opportunities for optimization. Our would-be competitors treat the SEM as just another kind of microscopic camera, but A SEM IS NOT A CAMERA! Only ASPEX has engineered its particle-analysis systems to take full advantage of dynamic electron-beam technology.


Another advantage of our integrated approach is that we exercise full control over and can provide comprehensive support for all components of the system. Because we engineer, manufacture, and test our products as systems, rather than interfacing them from multiple products at the customer's site, we can provide the kind of totally validated product assurance that allows us to meet the exacting standards of regulated industries.

And only ASPEX has focused on bringing this superior imaging technology to the factory-floor environment. From bottom to top, we design and build our systems, not for the researcher concerned with tweaking out publication-quality micrographs, but for bottom-line–oriented users with practical problems to solve on a routine basis. Because our concern is for providing answers fast and consistently in less-than-ideal environments for users whose objective is to get results, not master a new piece of instrumentation, we take a different path than others—though many will call our product an instrument, we are proud to call it a tool!

 

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