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ASPEX EXplorer™

The Only Integrated SEM/EDX System

Now in its third generation, the ASPEX EXplorer is a scanning electron microscope that is designed for the automated imaging and elemental analysis of a wide spectrum of surfaces and particulate. A unique blend of hardware ruggedization and software sophistication creates a system platform that is readily accessible.

The ASPEX EXplorer system provides a fully integrated SEM and EDX platform for addressing the microscale visualization needs of a diverse range of users. It seamlessly provides high magnification imaging, rapid nondestructive compositional analysis, and robust computer automation for size, shape and elemental composition.

Industry uses:

  • Forensics
  • Health Sciences
  • Industrial Automation
  • Metals

Industrialized by Design

The following founding manufacturing philosophies enable ASPEX’s units to be installed where the competition has never been:

  1. Stability & Reproducibility
  2. Minimized Downtime
  3. Reliability & Serviceability
  4. Evolved Staging
  5. Environmental Shielding
  6. Ease of Use
  7. Guaranteed Performance

Seamless Solutions for Microanalysis

Each ASPEX EXplorer comes equipped with the Perception software suite. When your needs go beyond manual microanalysis, Perception provides a powerful set of productivity tools for microanalysis.

Perception becomes the most efficient and accurate way to perform microanalysis when coupled with optional ASPEX software such as:

  1. AFA Automated Feature Analysis
  2. CFA Complex Feature Analysis
  3. MQA Metal Quality Analysis
  4. GSR Gun Shot Residue Analysis

Performance and Features

Guaranteed Performance**

Particle Detection Efficiency Greater than 95%
Particle Sizing Precision 0.25 microns or better
Particle Sizing Accuracy 0.5 microns or better
Occurrence of False Positives Less than 1 per mm2
Particles Sized per Hour Up to 33,000
Particles Sized per Hour Up to 10,000
(composition, size, morphology, imaging)

**Performance as measured using the Performance Grading System™ for features 1 to 100 μm.

Performance Specifications

Particle Detection Range 30nm to 5mm
Detectors SED, Quad BSED, SDD EDX
Accelerating Voltage 0.2 to 25 KeV Continuous
Stage Movement 80mm x 100mm
Vacuum system High Vac and Variable Pressure
Lightest Element Detection Boron
EDX Resolution 135 eV
Sizing Algorithms Available RCA and CFA
FDA Compliance Level cGMP
Data Security 21 CFR part 11 Compliant*

Sample Handling & Navigation

Specimen Coverage 6” Sample-Complete
Stage Motorization 80mm x 100mm XY, Manual Z 
Chamber Dimensions 180mm x 230mm x 140mm
Interactive Navigation MacroNavigator™

Valued Added Services

Advanced Training Custom, In-House or On-Site
Contract Services Automated Particle Analysis
Method Development Validated and Transferable
Consultation Concept to Commercialization

Field Service & Customer Support

Response Time 2-Hour Phone Response, 24/7
Field Service Engineers Pittsburgh headquarters and regionally based throughout the United States 
Remote Diagnostics Standard Component, enabling system operation
System Monitoring Harvester™ Software, monitoring and documenting multiple sub-system

*Indicates options available
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